Faculty Advisor: Dr. Benjamin Blalock

Title: 
Temperature Sensitive Behavioral Modeling of Analog to Digital Converters

Abstract:
Using commercial analog to digital converters (ADCs), especially outside their designed operating temperature range, is inherently risky and device performance inherently uncertain. Current methods of verification rely on expensive, time-consuming characterization procedures. A behavioral model capturing expected device performance, especially one which can be applied without testing, could enable system engineers to quickly downselect components for use within a system. To this end, a behavioral ADC model is described, tested and validated against measured performance.